SUBJECT

Title

Electron optical methods in geology

Type of instruction

lecture

Level

master

Part of degree program
Credits

2

Recommended in

Semester 3

Typically offered in

Autumn semester

Course description

Modern-day electron-beam instruments for the analyses of solid materials are presented, which are available in a variety of forms with wide range of capabilities. The two basic types of electron-beam instruments currently available are the scanning electron microscope (SEM) and the transmission electron microscope (TEM), these are discussed in detail. The optimization of specific electron-beam instruments target certain applications.

Readings

Mackinnon, I.D.R. & Mumpton, F.A. (1990): Electron-Optical Methods in Clay Science. Clay Minerals Society Workshop Lectures Volume 2, 169 p.