Investigation Methods of Material Structures II: Supramolecular Scale

Type of instruction




Part of degree program


Recommended in

Semester 4

Typically offered in

Spring semester

Course description

Investigation methods of material structures in supramolecular ranges: Light scattering (theory of static and dynamic light scattering, determination of diffusion standards and sizes of particles); X-ray- and neutron scattering, SAXS and SANS(supramolecular structuralinvestigations of amorphous materials with small and wide angle X-ray and neutron scattering, theories of X-ray and neutron scattering, comparison of SAXS and SANS, evaluation of scattering pattern, SAXS, SANS investigation of amorphous and some ordering showing materials); Electron and neutron diffractions(theories, instruments, neutron sours and detectors, application possibilities).

Morphological and surface investigation methods Electron microscope(theories and operational principles of scanning and transmission electron microscope); Scanning and atomic force microscope, AFM, STM(morphology of solid surfaces, phase structures of composite materials, determination of elastic modules, investigation of solid-liquid interfaces); Surface analysis, XPS(nanolayers atomic analysis, chemical structures, dept profile analysis); Reflection optical methods, ellipsometry, reflectometry, OWLS, SPR, direct force measurements(optical theories of methods, determinationsoflayer thickness, molecule orientations, microstructures, etc.)



  • P. Lindner, Th. Zemb (eds): Neutron, X-Ray and Light Scattering, North-Hollnad, Oxford, 1991.

  • Suggested: Editor(s): John C. Vickerman, Ian S. Gilmore: Surface Analysis - The Principal Techniques. Wiley Online Library 2009.

  • Peter J. Goodhew, John Humphreys, Richard Beanland: Electron Microscopy and Analysis. CRC Press, 2000.