Scanning Imaging Techniques in Materials Science
Microscopes - comparison of optical and scanning imaging - history, development and construction of scanning microscopes - scanning electronmicroscope (SEM) - confocal microscope - planar tunnelling spectroscopy – Topographiner - scanning tunnelling microscope (STM) - function and characteristics of scanning probe microscopes (SPM) - scanning tunnelling spectroscopy (STS) and it‘s applications - function and characteristics of atomic force microscope (AFM) - various imaging modes of AFM and it‘s applications - magnetic force microscope (MFM) and it‘s applications - scanning near field optical microscope (SNOM) and it‘s applications - the family of SPM‘s - image reconstruction - image modification - image analysis – application in electrochemistry - commercially available instruments - nanoindentation, nanomechanical testing and tribology.
Lecture slides and notes.
N. Garcia: Scanning tunneling microscopy, N-H Physics Pub. Amsterdam (1986)
Ashley Reginald Clarke: Microscopy Techniques for Materials Science, Woodhead Publishing, Cambridge, Boca Raton (2002)
Selected English language reviews and papers. Available on the internet.