The XPS Technique and Its Application
Surface analysis in general. The X-ray photoelectron spectroscopy as a surface analytical technique. Principle of the measurement, main parts of the instrument.
Determination of the atomic composition and chemical structure of the surface layer.
Qualitative and quantitative analysis, depth density profile by destructive and nondestructive methods.
Applications in various fields: inorganic, organic systems, determination of the surface coverage and layer thickness using different models.
Additional laboratory practice: demonstration and participation in spectrum analysis.
B.W. Rossiter, R.C. Baetzold (Eds.) Physical Methods of Chemistry, vol IXB Investigations of surfaces and Interfaces, Wiley, N. Y. 1993.
W.M. Riggs, J. M. Parker in Methods of Surface Analysis (Ed.: A. W. Czanderna), Elsevier, Amsterdam, 1989. pp. 103-158.